Anil K. Jain (PhD, 1973, Ohio State University; B. Tech., IIT Kanpur) is a University Distinguished Professor at Michigan State University where he conducts research in pattern recognition, machine learning, computer vision, and biometrics recognition. He was a member of the United States Defense Science Board and Forensics Science Standards Board. He has been awarded Guggenheim, Humboldt and Fulbright fellowships and King-Sun Fu Prize. For advancing pattern recognition and biometrics, Jain was awarded Doctor Honoris Causa by Universidad Autónoma de Madrid, Hong Kong University of Science and Technology and Hong Kong Baptist University. He was Editor-in-Chief of the IEEE Transactions on Pattern Analysis and Machine Intelligence and is a Fellow of ACM, IEEE, AAAS, and SPIE. Jain has been assigned 8 U.S. and Korean patents and is active in technology transfer for which he was elected to the National Academy of Inventors. Jain is a member of the U.S. National Academy of Engineering (NAE), foreign member of the Indian National Academy of Engineering (INAE), a member of The World Academy of Science (TWAS) and a foreign member of the Chinese Academy of Sciences (CAS). His list of publications is available at Google Scholar.