Yi Chen (PhD '07) and Anil Jain, University Distinguished Professor of Computer Science and Engineering, received Best Paper Award at the 3rd International Association of Pattern Recognition / IEEE International Conference on Biometrics (ICB 2009). Their paper is titled "Beyond Minutiae: A Fingerprint Individuality Model with Pattern, Ridge and Pore Features." ICB 2009 is the premier scientific conference devoted to the study of Biometric Authentication and Identification technologies. Read Beyond Minutiae: [PDF] |
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Design Day
April 26, 2013
